Tomaszewski, Tomasz ; Skibicki, Andrzej
Subject and Keywords:additive manufacturing ; high-cycle fatigue ; size effect ; data scatter ; defect ; Weibull distribution
Publisher: Date: Resource Type: Source:International Journal of Fatigue, Volume 182, May 2024, 108225 ; click here to follow the link
Language: License: Access Rights:Dla wszystkich zgodnie z powyższą licencją ; click here to follow the link